Timing-sequence testing of parallel programs

	Timing-sequence testing of parallel programs
	Liang, Y; Li, S; Zhang, H; Han, CD
	2000
发表期刊	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
ISSN	1000-9000
卷号	15 期号:1 页码:84-95
摘要	Testing of parallel programs involves two parts - testing of control-flow within the processes and testing of timing-sequence. This paper focuses on the latter, particularly on the timing-sequence of message-passing paradigms. Firstly the coarse-grained SYN-sequence model is built up to describe the execution of distributed programs. All of the topics discussed in this paper are based on it. The most direct way to test a program is to run it. A fault-free parallel program should be of both correct computing results and proper SYN-sequence. In order to analyze the validity of observed SYN-sequence, this paper presents the formal specification (Backus Normal Form) of the valid SYN-sequence. Till now there is little work about the testing coverage for distributed programs. Calculating the number of the valid SYN-sequences is the key to coverage problem, while the number of the valid SYN-sequences is terribly large and it is very hard to obtain the combination law among SYN-events. In order to resolve this problem, this paper proposes an efficient testing strategy - atomic SYN-event testing, which is to linearize the SYN-sequence (making it only consist of serial atomic SYN-events) first and then test each atomic SYN-event independently. This paper particularly provides the calculating formula about the number of the valid SYN-sequences for tree-topology atomic SYN-event (broadcast and combine). Furthermore, the number of valid SYN-sequences also, to some degree, mirrors the testability of parallel programs. Taking tree-topology atomic SYN-event as an example, this paper demonstrates the testability and communication speed of the tree-topology atomic SYN-event under different numbers of branches in order to achieve a more satisfactory tradeoff between testability and communication efficiency.
关键词	timing-sequence testing SYN-sequence atomic SYN-event linearization coverage
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号	WOS:000089936500009
出版者	SCIENCE PRESS
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13367
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Liang, Y
作者单位	Chinese Acad Sci, Inst Comp Technol, Ctr High Performance Comp, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Liang, Y,Li, S,Zhang, H,et al. Timing-sequence testing of parallel programs[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2000,15(1):84-95.
APA	Liang, Y,Li, S,Zhang, H,&Han, CD.(2000).Timing-sequence testing of parallel programs.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,15(1),84-95.
MLA	Liang, Y,et al."Timing-sequence testing of parallel programs".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 15.1(2000):84-95.