Intelligent analysis and off-line debugging of VLSI device test programs

	Intelligent analysis and off-line debugging of VLSI device test programs
	Ma, YH ; Shi, WC
	1999-06-01
发表期刊	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN	0923-8174
卷号	14 期号:3 页码:273-293
摘要	Today's microelectronics researchers design VLSI devices to achieve highly differentiated devices, both in performance and functionality. As VLSI devices become more complex, VLSI device testing becomes more costly and time consuming. The increasing test complexity leads to longer device test programs development time as well as more expensive test systems, and debugging test programs is a great burden to the test programs development. On the other hand, there is little formal theory of debugging, and attempts to develop a methodology of debugging are rare. The aim of the investigation in this paper is to create a theory to support analysis and debugging of VLSI device test programs, and then, on the basis of this theory, design and develop an off-line debugging environment, OLDEVDTP, for the creation, analysis, checking, identifying, error location, and correction of the device test programs off-line from the target VLSI test system, to achieve a dramatic cost and time reduction. In the paper, fuzzy comprehensive evaluation techniques are applied to the program analysis and debugging process to reduce restrictions caused by computational complexity. Analysis, design, and implementation of OLDEVDTP are also addressed in the paper.
关键词	test program error type off-line debugging environment fuzzy set FCE (fuzzy comprehensive evaluation) reference set evaluation space evaluation factor evaluation remark fuzzy relation test entity relevance coefficient
收录类别	SCI
语种	英语
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000084022500008
出版者	SPRINGER
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13301
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Ma, YH
作者单位	1.Advantest Amer Inc, Bethlehem, PA 18017 USA 2.Acad Sinica, Inst Comp Technol, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Ma, YH,Shi, WC. Intelligent analysis and off-line debugging of VLSI device test programs[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,1999,14(3):273-293.
APA	Ma, YH,&Shi, WC.(1999).Intelligent analysis and off-line debugging of VLSI device test programs.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,14(3),273-293.
MLA	Ma, YH,et al."Intelligent analysis and off-line debugging of VLSI device test programs".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 14.3(1999):273-293.