Observability statement coverage based on dynamic factored use-definition chains for functional verification

doi:10.1007/s10836-006-8634-3

	Observability statement coverage based on dynamic factored use-definition chains for functional verification
	Lv, Tao; Fan, Jian-Ping; Li, Xiao-Wei; Liu, Ling-Yi
	2006-06-01
发表期刊	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN	0923-8174
卷号	22 期号:3 页码:273-285
摘要	Simulation is still the primary verification method for integrated circuit designs, and coverage evaluation is indispensable for it on account of its incompleteness. As the functional complexity of modern designs is increasing dramatically, it is necessary to take observability into consideration for coverage metrics. In this paper we extend factored use-definition chains (FUD chains), a mature data structure in compilers, from sequential software to concurrent hardware design, and propose dynamic FUD chains (DFUD chains). Based on it, we present an observability model and an algorithm to evaluate observability-based statement coverage. This technique has several advantages. Firstly, it could be easily integrated into compilers or simulators for hardware description languages, since it utilizes many flow analysis techniques adopted in compilers. Secondly, it can be combined with many controllability metrics, such as statement coverage metric, since the observability model is based on definitions and uses of variables. The proposed technique has been implemented as a prototype tool for Verilog designs, and experimental results show its benefits.
关键词	design verification coverage metrics observability dynamic factored use-definition chains data-flow analysis
DOI	10.1007/s10836-006-8634-3
收录类别	SCI
语种	英语
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000240143200006
出版者	SPRINGER
引用统计	被引频次：5[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/10748
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Lv, Tao
作者单位	Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Adv Test Technol Lab, Beijing, Peoples R China
推荐引用方式 GB/T 7714	Lv, Tao,Fan, Jian-Ping,Li, Xiao-Wei,et al. Observability statement coverage based on dynamic factored use-definition chains for functional verification[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,2006,22(3):273-285.
APA	Lv, Tao,Fan, Jian-Ping,Li, Xiao-Wei,&Liu, Ling-Yi.(2006).Observability statement coverage based on dynamic factored use-definition chains for functional verification.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,22(3),273-285.
MLA	Lv, Tao,et al."Observability statement coverage based on dynamic factored use-definition chains for functional verification".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 22.3(2006):273-285.